%0 Journal Article
%T A critical review of fabrication challenges and reliability issues in top/bottom gated MoS2 field-effect transistors
%A Thoutam, Laxman Raju
%A Mathew, Ribu
%A Ajayan, J
%A Tayal, Shubham
%A Nair, Shantikumar V
%J Nanotechnology
%V 34
%N 23
%P 27
%@ 0957-4484
%D 2023-06-04
%I IOP Publishing
%~ DeepDyve