%0 Journal Article
%T P‐8: Analysis of Degradation Mechanism of Oxide Semiconductor FETs with High Tolerance to Intense NBTIS
%A Hosaka, Yasuharu
%A Obonai, Toshimitsu
%A Dobashi, Masayoshi
%A Nakayama, Tomonori
%A Shima, Yukinori
%A Ohno, Masakatsu
%A Yamazaki, Shunpei
%J Sid Symposium Digest of Technical Papers
%V 53
%N 1
%P 1066-1069
%@ 0097-966X
%D 2022-06-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve