%0 Journal Article
%T A low-cost concurrent TSV test architecture with lossless test output compression scheme
%A Lee, Young-woo
%A Lim, Hyunchan
%A Seo, Sungyoul
%A Cho, Keewon
%A Kang, Sungho
%J PLoS ONE
%V 14
%N 8
%D 2019-08-23
%I Public Library of Science
%~ DeepDyve