%0 Journal Article
%T Analysis and comparison of different methods used to extract isoclinic and isochromatic parameters. Application to the determination of the residual stresses inside crystal silicon wafers
%A Jagailloux, F.
%A Valle, V.
%J Strain
%V 54
%N 4
%P n/a-n/a
%@ 0039-2103
%D 2018-01-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve