%0 Journal Article
%T Optical ammeter for integrated circuit characterization and failure analysis
%A Claeys, W.
%A Dilhaire, S.
%A Lewis, D.
%A Quintard, V.
%A Phan, T.
%A Aucouturier, J. L.
%J Quality and Reliability Engineering International
%V 11
%N 4
%P 247-251
%@ 0748-8017
%D 1995-01-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve