%0 Journal Article
%T Positron-defect profiling in Cd1−xZnxTe wafers after saw cutting
%A Mcneil, Sean
%A Lynn, Kelvin
%A Weber, Marc
%A Szeles, Csaba
%A Soundararajan, Raji
%J Journal of Electronic Materials
%V 32
%N 6
%P 583-585
%@ 0361-5235
%D 2003-03-28
%I Springer-Verlag
%~ DeepDyve