%0 Journal Article
%T Accelerated Degradation of SiO/NCM Cell Quick Rechargeability Due to Depth-of-Discharge Range Dependent Failure Induced Li Dendrite Formation
%A Kim, Tae Hyeon
%A Park, Sung Su
%A Kang, Min Su
%A Kim, Ye Rin
%A Park, Ho Seok
%A Kim, Hyun-seung
%A Jeong, Goojin
%J Journal of The Electrochemical Society
%V 169
%N 2
%P 7
%@ 0013-4651
%D 2022-02-01
%I IOP Publishing
%~ DeepDyve