%0 Journal Article
%T Measurement of the Parameters of On-Wafer Semiconductor Devices
%A Savin, A.
%A Guba, V.
%A Bykova, O.
%J Measurement Techniques
%V 59
%N 7
%P 765-772
%@ 0543-1972
%D 2016-10-27
%I Springer US
%~ DeepDyve