%0 Journal Article
%T Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die
%A Murphy, Cynthia
%A Abadir, Magdy
%A Sandborn, Peter
%J Journal of Electronic Testing
%V 10
%N 2
%P 151-166
%@ 0923-8174
%D 2004-09-11
%I Kluwer Academic Publishers
%~ DeepDyve