%0 Journal Article
%T The Trends of In Situ Focused Ion Beam Technology: Toward Preparing Transmission Electron Microscopy Lamella and Devices at the Atomic Scale
%A Zhang, Zijian
%A Wang, Wanting
%A Dong, Zuoyuan
%A Yang, Xin
%A Liang, Fang
%A Chen, Xinqian
%A Wang, Chaolun
%A Luo, Chen
%A Zhang, Jiayan
%A Wu, Xing
%A Sun, Litao
%A Chu, Junhao
%J Advanced Electronic Materials
%V 8
%N 9
%D 2022-09-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve