%0 Journal Article
%T Measurement mark profiles of digital versatile disc and multilevel read-only disc with atomic force microscopy
%A Liu, Hailong
%A Pei, Jing
%J Proceedings of SPIE
%V 7517
%N 1
%P 75170D-75170D-6
%@ 0277-786X
%D 2009-08-24
%I SPIE
%~ DeepDyve