%0 Journal Article
%T Origin of performance degradation in vertical gate-all-around transistors using vertical InGaAs nanowires on SOI(111) substrates
%A Taniyama, Keita
%A Takeda, Yuki
%A Azuma, Yuki
%A Zheng, Ziye
%A Tomioka, Katsuhiro
%J Japanese Journal of Applied Physics
%V 64
%N 4
%P 5
%@ 0021-4922
%D 2025-04-01
%I IOP Publishing
%~ DeepDyve