%0 Journal Article
%T Analysis of the Leakage Current Origin in Thin Strain Relaxed Buffer Substrates
%A Eneman, G.
%A Simoen, E.
%A Delhougne, R.
%A Verheyen, P.
%A Simons, V.
%A Loo, R.
%A Caymax, M.
%A Claeys, C.
%A Vandervorst, W.
%A De Meyer, K.
%J Journal of the Electrochemical Society
%V 153
%N 5
%P G379-G384
%@ 0013-4651
%D 2006-03-09
%~ DeepDyve