%0 Journal Article
%T Snap-back temperature dependence for an Epi-CMOS ASIC-process up to 250 degrees C
%A Uffmann, Dirk
%J Proceedings of SPIE
%V 2875
%N 1
%P 85-96
%@ 0277-786X
%D 1996-09-13
%I SPIE
%~ DeepDyve