%0 Journal Article
%T Capacitance-voltage profiling of MOS capacitors: A case study of hands-on semiconductor testing for an undergraduate laboratory
%A Joy, J.
%A Date, M. P.
%A Arora, B. M.
%A Narasimhan, K. L.
%A Tallur, S.
%J American Journal of Physics
%V 86
%N 10
%P 787-796
%@ 0002-9505
%D 2018-10-11
%I American Association of Physics Teachers
%~ DeepDyve