%0 Journal Article
%T Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect
%A Yeh, Chung-Huang
%A Chen, Jwu-E
%J Sensors
%V 22
%N 11
%@ 1424-8220
%D 2022-05-30
%I Multidisciplinary Digital Publishing Institute
%~ DeepDyve