%0 Journal Article
%T Method to determine the interface’s fractal dimensions of metal-semiconductor electric contacts from their static instrumental characteristics
%A Torkhov, N.
%J Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
%V 4
%N 1
%P 45-58
%@ 1027-4510
%D 2010-03-01
%I SP MAIK Nauka/Interperiodica
%~ DeepDyve