%0 Journal Article
%T Evaluation of temperature dependent electrical transport parameters in Fe3O4/SiO2/n-Si metal–insulator-semiconductor (MIS) type Schottky barrier heterojunction in a wide temperature range
%A Nanda Kumar Reddy, Nallabala
%A Godavarthi, Srinivas
%A Mohan Kumar, Kesarla
%A Kummara, Venkata
%A Prabhakar Vattikuti, S.
%A Akkera, Harish
%A Bitla, Yugandhar
%A Jilani, S.
%A Manjunath, V.
%J Journal of Materials Science: Materials in Electronics
%V 30
%N 9
%P 8955-8966
%@ 0957-4522
%D 2019-04-02
%I Springer US
%~ DeepDyve