%0 Journal Article
%T Using statistical inverse methods for detecting defects in electronic components
%A Bissuel, Valentin
%A Dupuis, Quentin
%A Laraqi, Najib
%A Bauzin, Jean-Gabriel
%J Journal of Physics: Conference Series
%V 2116
%N 1
%P 5
%@ 1742-6588
%D 2021-11-01
%I IOP Publishing
%~ DeepDyve