%0 Journal Article %T Monitoring microstructure and phase transitions in thin films by high‐temperature resistivity measurements %A Abel, Marie‐Laure %A Carley, Albert %A Watts, John F. %J Surface and Interface Analysis %V 44 %N 8 %P 1162-1165 %@ 0142-2421 %D 2012-08-01 %I Wiley Subscription Services, Inc., A Wiley Company %~ DeepDyve