%0 Journal Article
%T Monitoring microstructure and phase transitions in thin films by high‐temperature resistivity measurements
%A Abel, Marie‐Laure
%A Carley, Albert
%A Watts, John F.
%J Surface and Interface Analysis
%V 44
%N 8
%P 1162-1165
%@ 0142-2421
%D 2012-08-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve