%0 Journal Article
%T Edge inversion channels and surface leakage currents in high-voltage semiconductor devices
%A Kyuregyan, A. S.
%J "Semiconductors"
%V 45
%N 3
%P 362-368
%@ 1063-7826
%D 2011-03-01
%I SP MAIK Nauka/Interperiodica
%~ DeepDyve