%0 Journal Article
%T Enhancement noise margin and delay time performance of novel punch-through nMOS for single-carrier CMOS
%A Lin, Jyi-Tsong
%A Xie, Pei-Zhang
%A Lee, Wei-Han
%J Discover Nano
%V 19
%N 1
%D 2024-07-06
%I Springer US
%~ DeepDyve