%0 Journal Article
%T Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling
%A Eberg,, Espen
%A Monsen, Åsmund, F.
%A Tybell,, Thomas
%A , van HelvoortAntonius T. J.
%A Holmestad,, Randi
%J Journal of Electron Microscopy
%V 57
%N 6
%P 175-179
%@ 2050-5698
%D 2008-12-01
%I Oxford Academic
%~ DeepDyve