%0 Journal Article
%T Analysis of organic multilayered samples for optoelectronic devices by (low‐energy) dynamic SIMS
%A Ngo, K. Q.
%A Philipp, P.
%A Jin, Y.
%A Morris, S. E.
%A Shtein, M.
%A Kieffer, J.
%A Wirtz, T.
%J Surface and Interface Analysis
%V 43
%N 1‐2
%P 194-197
%@ 0142-2421
%D 2011-01-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve