%0 Journal Article
%T Leakage Current Degradation Due to Ion Drift and Diffusion in Tantalum and Niobium Oxide Capacitors
%A Kuparowitz, Martin
%A Sedlakova, Vlasta
%A Grmela, Lubomir
%J Metrology and Measurement Systems
%V 24
%N 2
%@ 2300-1941
%D 2017-06-27
%I Walter de Gruyter
%~ DeepDyve