%0 Journal Article
%T Rugged multiwavelength NIR and IR analyzers for industrial process measurements
%A Hyvarinen, Timo S.
%A Niemela, Pentti
%J Proceedings of SPIE
%V 1266
%N 1
%P 99-104
%@ 0277-786X
%D 1990-08-01
%I SPIE
%~ DeepDyve