%0 Journal Article
%T Reliability of diagnostic methods based on low-frequency noise analysis
%A Gorlov, M. I.
%A Smirnov, D. Yu.
%A Koz’yakov, N. N.
%J "Semiconductors"
%V 43
%N 13
%P 1737-1741
%@ 1063-7826
%D 2009-12-01
%I SP MAIK Nauka/Interperiodica
%~ DeepDyve