%0 Journal Article
%T Piecewise linear second moment statistical simulation of ICs affected by non‐linear statistical effects
%A Biagetti, Giorgio
%A Crippa, Paolo
%A Curzi, Alessandro
%A Orcioni, Simone
%A Turchetti, Claudio
%J International Journal of Circuit Theory and Applications
%V 38
%N 9
%P 969-993
%@ 0098-9886
%D 2010-11-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve