%0 Journal Article
%T Admittance Measurements of Au/SnO2/p-InP (MOS) Device
%A Güngör, Önder
%A Ertuğrul Uyar, Raziye
%A Tataroğlu, Adem
%J ECS Journal of Solid State Science and Technology
%V 14
%N 3
%P 6
%@ 2162-8769
%D 2025-03-01
%I IOP Publishing
%~ DeepDyve