%0 Journal Article
%T Trapped particle detection in bonded semiconductors using gray-field photoelastic imaging
%A Horn, G.
%A Mackin, T.
%A Lesniak, J.
%J Experimental Mechanics
%V 45
%N 5
%P 457-466
%@ 0014-4851
%D 2006-05-10
%I Kluwer Academic Publishers
%~ DeepDyve