%0 Journal Article
%T Knowledge aided expert system for failure analysis of electronic components
%A Yaru, Cui
%A Kui, Zhang
%A Lijing, Yin
%A Shengbiao, An
%A Jie, Huang
%J Journal of Physics: Conference Series
%V 1693
%N 1
%P 7
%@ 1742-6588
%D 2020-12-17
%~ DeepDyve