%0 Journal Article
%T Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor
%A Gontard, Lionel, C.
%A Moldovan,, Grigore
%A Carmona-Galán,, Ricardo
%A Lin,, Chao
%A Kirkland, Angus, I.
%J Microscopy
%V 63
%N 2
%P 119-130
%@ 0022-0744
%D 2014-04-01
%I The Japanese Society of Microscopy
%~ DeepDyve