%0 Journal Article
%T The development of a novel apparatus to measure the emissivity of high-roughness materials at 82 K
%A Dewasi, Avijit
%A Gangradey, Ranjana
%A Mukherjee, Samiran Shanti
%A Gupta, Vishal
%A Dutta, Rohan
%A Desai, Abhinav B
%A Mishra, Jyoti S
%A Panchal, Paresh
%A Nayak, Pratik A
%A Agravat, Hemang S
%J Measurement Science and Technology
%V 34
%N 12
%P 10
%@ 0957-0233
%D 2023-12-01
%I IOP Publishing
%~ DeepDyve