%0 Journal Article
%T Data analytics to reduce stop-on-fail test in electronics manufacturing
%A Herrera, Ana Elsa Hinojosa
%A Stoyanov, Stoyan
%A Bailey, Chris
%A Walshaw, Chris
%A Yin, Chunyan
%J Open Computer Science
%V 9
%N 1
%P 200-211
%D 2019-01-01
%I De Gruyter Open
%~ DeepDyve