%0 Journal Article
%T Insulated-ceystal method for measuring electrical properties of thin semiconducting films
%A Kovtonyuk, N.
%A Amrinov, N.
%A Magomedov, A.
%J Russian Physics Journal
%V 14
%N 5
%P 653-656
%@ 1064-8887
%D 2004-11-29
%I Kluwer Academic Publishers-Plenum Publishers
%~ DeepDyve