%0 Journal Article
%T SEM–EBIC investigation of silicon, compensated by zinc during high temperature diffusion annealing
%A Yakimov, E.
%A Privezentsev, V.
%J Journal of Materials Science: Materials in Electronics
%V 19
%N 1
%P 277-280
%@ 0957-4522
%D 2008-05-24
%I Springer US
%~ DeepDyve