%0 Journal Article
%T Semiconductor device burn‐in, is there a future?
%A Parsons, Ron
%J Quality and Reliability Engineering International
%V 2
%N 4
%P 255-258
%@ 0748-8017
%D 1986-01-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve