%0 Journal Article
%T Improvement of resolution by maximum entropy linear image restoration for NiSi2/Si interface
%A Chen,, Fu-Rong
%A Kai, J., J.
%A Chang,, L.
%A Wang, J., Y.
%A Chen, W., J.
%J Journal of Electron Microscopy
%V 48
%N 6
%@ 2050-5698
%D 1999-01-01
%I Narnia
%~ DeepDyve