%0 Journal Article
%T The Effect of Focused Ion Beam (Fib) Specimen Geometry on X-Ray Fluorescence During Energy Dispersive X-Ray Spectroscopy (EDS) Analysis in the Transmission Electron Microscope (TEM)
%A Longo, David M
%A Howe, James M
%A Johnson, William C
%J Microscopy and Microanalysis
%V 4
%N S2
%P 856-857
%@ 1431-9276
%D 1998-07-01
%~ DeepDyve