%0 Journal Article
%T Automatic Trap Detection: A Debugging Mechanism for Abnormal Specification in the IMS Sequencing Controls
%A Lin, F.H.
%A Shih, T.K.
%A ,
%J IEEE Transactions on Learning Technologies
%@ 1939-1382
%D 2008-07-01
%I Institute of Electrical and Electronics Engineers (IEEE)
%~ DeepDyve