%0 Journal Article
%T Multi-variable process data compression and defect isolation using wavelet PCA and genetic algorithm
%A Chaouch, Hanen
%A Najeh, Tawfik
%A Nabli, Lotfi
%J The International Journal of Advanced Manufacturing Technology
%V 91
%N 4
%P 869-878
%@ 0268-3768
%D 2016-11-29
%I Springer London
%~ DeepDyve