%0 Journal Article
%T Measurement of Contact Resistivity In Symmetric Polycrystalline Si/SiOx/Monocrystalline Si Test Structures Using Variable Light Illumination
%A Steyn, Dirk W.
%A Nemeth, William
%A Page, Matthew
%A Theingi, San
%A Young, David L.
%A Agarwal, Sumit
%A Stradins, Paul
%J Solar Rrl
%V 9
%N 8
%D 2025-04-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve