%0 Journal Article
%T Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study
%A Fu, Wenhan
%A Chien, Chen-Fu
%A Tang, Lizhen
%J Journal of Intelligent Manufacturing
%V 33
%N 3
%P 785-798
%@ 0956-5515
%D 2022-03-01
%I Springer US
%~ DeepDyve