%0 Journal Article
%T Transmission Electron Microscope Characterization of Siz Selective Deposition of Si-Nanoparticles
%A Wu, Hai-Ping
%A Nishimura, Kimihiro
%A Kebaili, Nouari
%A Fujinuma, Haruko
%A Takayanagi, Kunio
%J Microscopy and Microanalysis
%V 5
%N S2
%P 752-753
%@ 1431-9276
%D 1999-08-01
%~ DeepDyve