%0 Journal Article
%T Fault-Tolerant Memory Architecture Against Radiation-Dependent Errors: A Mixed Error Control Approach
%A Mocanu, Octavian-Dumitru
%A Oliver, Joan
%J Journal of Electronic Testing
%V 14
%N 2
%P 169-180
%@ 0923-8174
%D 2004-09-29
%I Kluwer Academic Publishers
%~ DeepDyve