%0 Journal Article
%T Thickness Identification of Thin InSe by Optical Microscopy Methods
%A Zhao, Qinghua
%A Puebla, Sergio
%A Zhang, Wenliang
%A Wang, Tao
%A Frisenda, Riccardo
%A Castellanos-Gomez, Andres
%J Advanced Photonics Research
%V 1
%N 2
%P n/a-n/a
%D 2020-12-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve