%0 Journal Article
%T De‐embedding method‐based electrical resistivity characterisation scheme for a small brittle pillar‐shaped material
%A Lee, J.
%A Kim, J.
%A Lim, S.‐Y.
%A Kwon, J.‐Y.
%A Im, J.
%A Lee, S.‐M.
%A Moon, S.E.
%J Electronics Letters
%V 53
%N 14
%P 930-931
%D 2017-07-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve