%0 Journal Article
%T Development of Concurrent Error Detection Circuit Based on Automated Generation of Error-Correcting Code
%A Stempkovsky, A.L.
%A Telpukhov, D.V.
%A Zhukova, T.D.
%A RAS, IPPM
%A RAS, IPPM
%A RAS, IPPM
%A ,
%J Problems of advanced micro- and nanoelectronic systems development
%@ 2078-7707
%D 2022-01-01
%I FSFIS Institute for Design Problems in Microelectronics RAS
%~ DeepDyve