%0 Journal Article
%T Modeling and parameter extraction of test fixtures for MOSFET on‐wafer measurements up to 60 GHz
%A Álvarez‐Botero, Germán
%A Torres‐Torres, Reydezel
%A Murphy‐Arteaga, Roberto S.
%J International Journal of Rf and Microwave Computer-Aided Engineering
%V 23
%N 6
%P 655-661
%@ 1096-4290
%D 2013-10-01
%I Wiley Subscription Services, Inc., A Wiley Company
%~ DeepDyve