%0 Journal Article
%T Local electrical properties of n-AlInAs/i-GaInAs electron channel structures characterized by theprobe-electron-beam-induced current technique
%A Watanabe,, Kentaro
%A Nokuo,, Takeshi
%A Chen,, Jun
%A Sekiguchi,, Takashi
%J Microscopy
%V 63
%N 2
%P 161-166
%@ 0022-0744
%D 2014-04-01
%I The Japanese Society of Microscopy
%~ DeepDyve