%0 Journal Article %T Local electrical properties of n-AlInAs/i-GaInAs electron channel structures characterized by theprobe-electron-beam-induced current technique %A Watanabe,, Kentaro %A Nokuo,, Takeshi %A Chen,, Jun %A Sekiguchi,, Takashi %J Microscopy %V 63 %N 2 %P 161-166 %@ 0022-0744 %D 2014-04-01 %I The Japanese Society of Microscopy %~ DeepDyve